Wim J. van der LindenUniversity of Twente, The Netherlands
Title: The New Paradigm of Adaptive Testing
Bio: Wim J. van der Linden is Professor Emeritus of Measurement and Data Analysis, University of Twente, Enschede, The Netherlands. He is a former Distinguished Scientist and Director of Research and Innovation, Pacific Metrics Corporation, Monterey, CA, and Chief Research Scientist, CTB/McGraw-Hill, Monterey, CA. Dr. van der Linden received his PhD in psychometrics from the University of Amsterdam. His research interests include item response theory, adaptive testing, optimal test assembly, observed-score equating, parameter linking, statistical detection of cheating and response time modeling. He is the author of Linear Models for Optimal Test Design (Springer, 2005) and the editor of the three-volume Handbook of Item Response Theory: Models, Statistical Tools, and Applications (Chapman & Hall/CRC, 2016, 2018). He is also a co-editor of Computerized Adaptive Testing: Theory and Applications (Kluwer, 2000; with C. A. W. Glas), and its sequel Elements of Adaptive Testing (Springer, 2010; with C. A. W. Glas). Dr. van der Linden has served on the editorial boards of nearly every major test-theory journal and is co-editor for the Chapman & Hal//CRC Series on Statistics for Social and Behavioral Sciences. He is also a former President of the National Council on Measurement in Education (NCME) and the Psychometric Society, Fellow of the Center for Advanced Study in the Behavioral Sciences, Stanford, CA, was awarded an Honorary Doctorate from Umea University in Sweden in 2008, and is a recipient of the AERA E. F. Lindquist Award as well as the ATP, NCME and Psychometric Career Achievement Awards for his work on educational measurement.